File:Silicium-atomes.png
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Summary
| Description |
English: Silicon atoms observed at the surface of a silicon carbide (SIC) crystal using a Scanning Tunneling Microscope (STM)
Français : Atomes de silicium observés à la surface d'un cristal de carbure de silicium (SiC) à l'aide d'un microscope à effet tunnel (STM) |
| Date | |
| Source | Image de microscopie à effet tunnel réalisée au lppm à Orsay |
| Author | Guillaume Baffou |
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Permission is granted to copy, distribute and/or modify this document under the terms of the GNU Free Documentation Licence, Version 1.2 or any later version published by the Free Software Foundation; with no Invariant Sections, no Front-Cover Texts, and no Back-Cover Texts. A copy of the licence is included in the section entitled GNU Free Documentation Licence. |
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 18:47, 9 April 2010 | | 177 × 177 (54 KB) | wikimediacommons>Guillaume.Baffou~commonswiki | {{Information |Description={{en|1=Silicon atoms observed at the surface of a silicon carbide (SIC) crystal using a Scanning Tunneling Microscope (STM)}} {{fr|1=Atomes de silicium observés à la surface d'un cristal de carbure de silicium (SiC) à l'aide |
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